Publication:
Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy
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1980 since deposited on 2021-10-22
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Acq. date: 2025-12-09
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1980 since deposited on 2021-10-22
2last month
1last week
Acq. date: 2025-12-09
Citations