Publication:
In-depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1903 since deposited on 2021-10-22
1last month
Acq. date: 2025-12-08
Citations
Metrics
Views
1903 since deposited on 2021-10-22
1last month
Acq. date: 2025-12-08
Citations