In-depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature

Publication:

2014

Journal article

Author(s)

Achour, H.

;

Cretu, Bogdan

;

Routoure, Jean-Marc

;

Carin, Regis

;

Talmat, Rachida

;

Benfdila, A.

;

;

Claeys, Cor

Solid-State Electronics

1904 since deposited on 2021-10-22

Acq. date: 2026-04-05