Browsing by Author "Bhoir, Mandar S."
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Publication Analog performance and its variability in sub-10 nm fin-width FinFETs: a detailed analysis
Journal article2019, IEEE Journal of the Electron Devices Society, 7, p.1217-1224Publication Process-induced V-t variability in nanoscale FinFETs: Does V-t extraction methods have any impact?
Proceedings paper2020, IEEE Electron Devices Technology and Manufacturing Conference (EDTM), MAR 16-18, 2020Publication Variability sources in nanoscale bulk FinFETs and TiTaN- a promising low variability WFM for 7/5nm CMOS nodes
Proceedings paper2019, 65th IEEE International Electron Devices Meeting - IEDM, 7/12/2019, p.859-862