Browsing by Author "Bhuva, B.L."
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Publication Impact of back-gate bias and fevice geometry on the total ionizing dose response of 1-transistor floating body RAMs
Journal article2012, IEEE Transactions on Nuclear Science, (59) 6, p.2966-2973Publication Total ionizing dose effects on ultra thin buried oxide floating body memories
Proceedings paper2012-04, IEEE International Reliability Physics Symposium - IRPS, 15/04/2012, p.MY-3Publication Total-ionizing-dose effects on ultrathin-body-and-buried- oxide MOSFETs
Oral presentation2012, IEEE Nuclear and Space Radiation Effects Conference - NSREC