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Total-ionizing-dose effects on ultrathin-body-and-buried- oxide MOSFETs
Publication:
Total-ionizing-dose effects on ultrathin-body-and-buried- oxide MOSFETs
Date
2012
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mahatme, Nihaar
;
Zhang, E.X.
;
Linten, Dimitri
;
Griffoni, A.
;
Aoulaiche, Marc
;
Simoen, Eddy
;
Jurczak, Gosia
;
Bhuva, B.L.
;
Reed, R.A.
;
Schrimpf, R.D.
;
Fleetwood, D.M.
;
Groeseneken, Guido
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1935
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1935
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations