Publication:

Total-ionizing-dose effects on ultrathin-body-and-buried- oxide MOSFETs

Date

2012
Presentation
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dc.contributor.authorMahatme, Nihaar
dc.contributor.authorZhang, E.X.
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGriffoni, A.
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorSimoen, Eddy
dc.contributor.authorJurczak, Gosia
dc.contributor.authorBhuva, B.L.
dc.contributor.authorReed, R.A.
dc.contributor.authorSchrimpf, R.D.
dc.contributor.authorFleetwood, D.M.
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-20T13:04:40Z
dc.date.available2021-10-20T13:04:40Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21076
dc.source.conferenceIEEE Nuclear and Space Radiation Effects Conference - NSREC
dc.source.conferencedate16/07/2012
dc.source.conferencelocationMiami, FL USA
dc.title

Total-ionizing-dose effects on ultrathin-body-and-buried- oxide MOSFETs

dc.typeOral presentation
dspace.entity.typePublication
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