Browsing by Author "Bina, M."
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Publication A reliable method for the extraction of the lateral position of defects in ultra-scaled MOSFETs
Proceedings paper2014, International Reliability Physics Symposium - IRPS, 1/06/2014, p.XT.13Publication Direct tunneling and gate current fluctuations
; Kosina, H.Proceedings paper2013, International Conference on Simulation of Semiconductor Processes and Devices - SISPAD, 3/09/2013, p.17-20Publication Multiphonon processes as the origin of reliability issues
Proceedings paper2013, Semiconductors, Dielectrics, and Materials for Nanoelectronics II, 27/10/2013, p.31-47Publication Understanding correlated drain and gate current fluctuations
; Grasser, T.Proceedings paper2013, 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA, 15/07/2013, p.51-56