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Browsing by Author "Bisi, D."

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    Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulation

    Marino, F.A.
    ;
    Bisi, D.
    ;
    Meneghini, M.
    ;
    Verzellesi, G.
    ;
    Zanoni, E.
    ;
    Van Hove, Marleen
    ;
    You, Shuzhen  
    Journal article
    2015, Solid-State Electronics, 113, p.9-14
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    Reverse-bias degradation of AlGaN/GaN vertical Schottky diodes: an investigation based on electrical and capacitive measurements

    Meneghini, M.
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    Bertin, M.
    ;
    Dal Santo, G.
    ;
    Stocco, A.
    ;
    Bisi, D.
    ;
    Marcon, Denis  
    ;
    Malinowski, Pawel  
    Proceedings paper
    2012, International Symposium on Compound Semiconductor, 27/08/2012

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