Publication:

Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulation

Date

2015

Journal article

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Author(s)

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Van Hove, Marleen

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Decoutere, Stefaan

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Stoffels, Steve

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Journal

Solid-State Electronics

Statistics

1882 since deposited on 2021-10-22

2last month

Acq. date: 2026-02-24