Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulation

Simple item page Full metadata Statistics

Author(s)

;

;

;

;

;

Van Hove, Marleen

;

;

Decoutere, Stefaan

;

;

Stoffels, Steve

;

;

Journal

Solid-State Electronics

Metrics

1873 since deposited on 2021-10-22

Acq. date: 2025-10-23