Publication:

Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulation

Date

2015
Journal article
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dc.contributor.authorMarino, F.A.
dc.contributor.authorBisi, D.
dc.contributor.authorMeneghini, M.
dc.contributor.authorVerzellesi, G.
dc.contributor.authorZanoni, E.
dc.contributor.authorVan Hove, Marleen
dc.contributor.authorYou, Shuzhen
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorMarcon, Denis
dc.contributor.authorStoffels, Steve
dc.contributor.authorRonchi, Nicolo
dc.contributor.authorMeneghesso, G.
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.imecauthorMarcon, Denis
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorRonchi, Nicolo
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.contributor.orcidimecRonchi, Nicolo::0000-0002-7961-4077
dc.date.accessioned2021-10-22T20:55:22Z
dc.date.available2021-10-22T20:55:22Z
dc.date.issued2015
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25617
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0038110115001446
dc.source.beginpage9
dc.source.endpage14
dc.source.journalSolid-State Electronics
dc.source.volume113
dc.title

Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulation

dc.typeJournal article
dspace.entity.typePublication
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