Browsing by Author "Blackstone, S."
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Publication Excess carrier lifetime and surface recombination velocity in dielectrically isolated Si-tubes
Proceedings paper1998, Proceedings of the 4th International Symposium on Semiconductor Wafer Bonding: Science, Technology, and Applications, 31/08/1997, p.257-263Publication Excess carrier lifetime and surface recombination velocity in dielectrically isolated Si-tubs
Oral presentation1997, 1997 Joint International Meeting ECS (Electrochemical Society) and ISE (International Society of Electrochemistry) : 4th Interna