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Excess carrier lifetime and surface recombination velocity in dielectrically isolated Si-tubs
Publication:
Excess carrier lifetime and surface recombination velocity in dielectrically isolated Si-tubs
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Date
1997
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Meynants, Guy
;
Poortmans, Jef
;
Mertens, Robert
;
Polce, N.
;
Jones, S.
;
Blackstone, S.
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1932
since deposited on 2021-09-30
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last week
Acq. date: 2025-12-13
Citations
Metrics
Views
1932
since deposited on 2021-09-30
1
last month
1
last week
Acq. date: 2025-12-13
Citations