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Excess carrier lifetime and surface recombination velocity in dielectrically isolated Si-tubs
Publication:
Excess carrier lifetime and surface recombination velocity in dielectrically isolated Si-tubs
Date
1997
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Meynants, Guy
;
Poortmans, Jef
;
Mertens, Robert
;
Polce, N.
;
Jones, S.
;
Blackstone, S.
Journal
Abstract
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1929
since deposited on 2021-09-30
434
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1929
since deposited on 2021-09-30
434
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations