Publication:
Excess carrier lifetime and surface recombination velocity in dielectrically isolated Si-tubs
Date
| dc.contributor.author | Meynants, Guy | |
| dc.contributor.author | Poortmans, Jef | |
| dc.contributor.author | Mertens, Robert | |
| dc.contributor.author | Polce, N. | |
| dc.contributor.author | Jones, S. | |
| dc.contributor.author | Blackstone, S. | |
| dc.contributor.imecauthor | Poortmans, Jef | |
| dc.contributor.imecauthor | Mertens, Robert | |
| dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
| dc.date.accessioned | 2021-09-30T09:18:14Z | |
| dc.date.available | 2021-09-30T09:18:14Z | |
| dc.date.issued | 1997 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2022 | |
| dc.source.conference | 1997 Joint International Meeting ECS (Electrochemical Society) and ISE (International Society of Electrochemistry) : 4th Interna | |
| dc.source.conferencelocation | ||
| dc.title | Excess carrier lifetime and surface recombination velocity in dielectrically isolated Si-tubs | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |