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Browsing by Author "Borden, P."

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    Carrier illumination as a tool to probe implant dose and electrical activation

    Vandervorst, Wilfried  
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    Clarysse, Trudo
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    Brijs, Bert
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    Loo, Roger  
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    Peytier, Ivan
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    Pawlak, Bartek  
    Proceedings paper
    2003, Characterization and Metrology for ULSI Technology, 24/03/2003, p.758-763
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    Carrier illumination for characterization of ultrashallow doping profiles

    Clarysse, Trudo
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    Lindsay, Richard
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    Vandervorst, Wilfried  
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    Budiarto, E.
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    Borden, P.
    Journal article
    2004-02, Journal of Vacuum Science and Technology B, (22) 1, p.439-443
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    Carrier illumination for monitoring of CMOS ultra-shallow junctions

    Clarysse, Trudo
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    Vandervorst, Wilfried  
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    Lindsay, Richard
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    Borden, P.
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    Budiarto, E.
    Oral presentation
    2002, E-MRS Spring Meeting Symposium E: Advanced Characterisation of Semiconductor Materials and Devices
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    Junction and profile analysis using carrier illumination

    Clarysse, Trudo
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    Vandervorst, Wilfried  
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    Lindsay, Richard
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    Borden, P.
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    Budiarto, E.
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    Madsen, J.
    Proceedings paper
    2002, Silicon Front-End Junction Formation Technologies, 1/04/2002, p.285-290
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    Progress towards an electrically active, ultra-shallow junction depth reference for carrier illumination, SRP and SIMS

    Borden, P.
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    Bechtler, L.
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    Klemme, B.
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    Nijmeijer, R.
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    Judge, E.
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    Diebold, A.
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    Bennett, J.
    Proceedings paper
    2001, 6th Int. Workshop on Fabrication, Characterization and Modeling of Ultra-Shallow Doping Profiles in Semiconductors - USJ, 22/04/2001, p.161-167

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