Browsing by Author "Bosman, Gijs"
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Publication A low-frequency noise study of state-of-the-art silicon n+p junction diodes
Proceedings paper1995, Noise in Physical Systems and 1/f Fluctuations - ICNF. Proceedings of the 13th International Conference, 29/05/1995, p.537-540Publication Bulk defect induced low-frequency noise in n+-p silicon diodes
Journal article1998, IEEE Trans. Electron Devices, (45) 12, p.2528-2536Publication Extended defect related excess low-frequency noise in Si junction diodes
Proceedings paper1996, Defect Recognition and Image Processing in Semiconductors - DRIP. Proceedings of the 6th International Conference, 3/12/1995, p.133-138Publication Impact of the substrate on the low-frequency noise of silicon n+p junction diodes
Journal article1995, Applied Physics Letters, (66) 19, p.2507-9Publication Impact of the substrate quality on the low frequency noise of silicon diodes
Oral presentation1994, 6th Van der Ziel Symposium on Quantum 1/f Noise and Other Low Frequency Fluctuations in Electronic DevicesPublication Impact of the substrate quality on the low frequency noise of silicon diodes
Proceedings paper1996, 6th Quantum 1/f Noise and Other Low frequency Fluctuations in Electronic Devices Symposium, 27/05/1994, p.96-104Publication Noise characterization of gated silicon p-n diodes
Proceedings paper1997, Noise in Physical Systems and 1/f Fluctuations: Proceedings of the 14th International Conference, 14/07/1997, p.542-545Publication On the electrical activity of oxygen-related extended defects in silicon
Proceedings paper1994, Proceedings of the 7th International Symposium on Silicon Materials Science and Technology - Semiconductor Silicon/1994, 22/05/1994, p.670-683Publication On the impact of low fluence irradiation with MeV particles on silicon diode characteristics and related material properties
Journal article1994, IEEE Transactions on Nuclear Science, (41) 6, p.1924-1931Publication The impact of the substrate on the electrical performance of silicon junction diodes
Proceedings paper1994, 24th European Solid State Device Research Conference - ESSDERC, 11/09/1994, p.177-180