Browsing by Author "Brablec, A."
Now showing 1 - 2 of 2
- Results per page
- Sort Options
Publication Spectroellipsometric characterisation of thin epitaxial Si1-x Gex layers
Journal article1995, Materials Science and Technology, (11) 10, p.1065-1070Publication Spectroellipsometric Characterization of Thin Epitaxial Si1-xGex Layers
Oral presentation1994, 1st International Conference on Materials for Microelectronics; October 17-19, 1994; Barcelona, Spain.