Browsing by Author "Brand, Adam"
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Publication Highly scalable bulk FinFET devices with multi-VT options by conductive metal gate stack tuning for the 10-nm node and beyond
Proceedings paper2014, VLSI Technology Symposium, 9/06/2014, p.56-57Publication RMG nMOS 1st process enabling 10x lower gate resistivity in N7 bulk FinFETs
Proceedings paper2015, Symposium on VLSI Technology, 15/06/2015, p.148-149