Browsing by Author "Buschhardt, Thomas"
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Publication Smooth and high quality epitaxial strained Ge grown on SiGe strain relaxed buffers with 70 - 85% Ge
Proceedings paper2010-05, 5th International SiGe Technology and Device Meeting - ISTDM, 24/05/2010Publication Smooth and high quality epitaxial strained Ge grown on siGe strain relaxed buffers with 70-80% Ge
Journal article2011, Journal of Crystal Growth, (324) 1, p.15-21