Browsing by Author "Bychikhin, S."
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Publication HBM ESD robustness of GaN-on-Si Schottky diodes
Journal article2012, IEEE Transactions on Device and Materials Reliability, (12) 4, p.589-598Publication IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors
Journal article2012, Microelectronics Reliability, (52) 9_10, p.2194-2199