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Browsing by Author "Caers, J."

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    Optimal choice of the FEM damage volumes for estimation of the solder joint reliability for electronic package assemblies

    Vandevelde, Bart  
    ;
    Gonzalez, Mario  
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    Beyne, Eric  
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    Zhang, G.Q.
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    Caers, J.
    Proceedings paper
    2003, Proceedings of the 53rd Electronic Components and Technology Conference, 27/05/2003, p.589-596
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    Parameterised modelling of thermo-mechanical reliability for CSP assemblies

    Vandevelde, Bart  
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    Beyne, Eric  
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    Zhang, K.G.Q.
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    Caers, J.
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    Vandepitte, D.
    ;
    Baelmans, M.
    Journal article
    2003, ASME Journal of Electronic Packaging, (125) 4, p.498-805
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    Parametrised modelling of thermo-mechanical reliability

    Vandevelde, Bart  
    ;
    Beyne, Eric  
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    Zhang, G. Q.
    ;
    Caers, J.
    Proceedings paper
    2001, Proceedings of the 2nd Eurosime Conference; 9-11 April 2001; Paris, France., p.49-54
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    Solder parameter sensitivity for CSP life-time prediction using simulation-based optimization method

    Vandevelde, Bart  
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    Beyne, Eric  
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    Zhang, K. G. Q.
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    Caers, J.
    Proceedings paper
    2001, Proceedings 51st Electronic Components and Technology Conference, 29/05/2001, p.281-287
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    Thermo-mechanical reliability optimisation of small sized SMD components

    Vandevelde, Bart  
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    Beyne, Eric  
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    Roggen, Jean
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    Caers, J.
    ;
    Van Veen, C.
    Journal article
    1999, VTE - Aufbau und Verbindungstechnik in der Electronik, 2, p.88-92
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    Thermo-mechanical reliability optimisation of small sized SMD components

    Vandevelde, Bart  
    ;
    Beyne, Eric  
    ;
    Roggen, Jean
    ;
    Caers, J.
    ;
    Van Veen, C.
    Proceedings paper
    1998, 3rd European Conf. on Electronic Packaging Technology and 9th Int. Conf. on Interconnection Technology in Electronics, 15/06/1998, p.100-102

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