Browsing by Author "Camargo, V. V. A."
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Publication Circuit simulation of workload-dependent RTN and BTI based on trap kinetics
Journal article2014, Microelectronics Reliability, (54) 11, p.2364-2370Publication Recent trends in CMOS reliability: from individual traps to circuit simulations
Oral presentation2012, ON SemiconductorPublication Use of SSTA tools for evaluating BTI impact on combinational circuits
Journal article2014, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, (22) 2, p.280-285