Browsing by Author "Campabadal, Francesca"
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Publication Progressive degradation of TiN/SiON and TiN/HfO2 gate stack triple gate SOI nFinFETs subjected to electrical stress
Oral presentation2008, 15th Workshop on Dielectrics in Microelectronics - WoDIMPublication Standards for the Characterization of Endurance in Resistive Switching Devices
Journal article review2021, ACS NANO, (15) 11, p.17214-17231