Publication:

Standards for the Characterization of Endurance in Resistive Switching Devices

Date

2021
Journal Article Review
https://doi.org/10.1021/acsnano.1c06980
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Published version 9.42 MB

Author(s)

Lanza, Mario
;
Waser, Rainer
;
Ielmini, Daniele
;
Yang, J. Joshua
;
Goux, Ludovic  
;
Sune, Jordi
;
Kenyon, Anthony Joseph
;
Mehonic, Adnan
;
Spiga, Sabina
;
Rana, Vikas
;
Wiefels, Stefan
;
Menzel, Stephan
;
Valov, Ilia
;
Villena, Marco A.
;
Miranda, Enrique
;
Jing, Xu
;
Campabadal, Francesca
;
Gonzalez, Mireia B.
;
Aguirre, Fernando
;
Palumbo, Felix
;
Zhu, Kaichen
;
Roldan, Juan Bautista
;
Puglisi, Francesco Maria
;
Larcher, Luca
;
Hou, Tuo-Hung
;
Prodromakis, Themis
;
Yang, Yuchao
;
Huang, Peng
;
Wan, Tianqing
;
Chai, Yang
;
Pey, Kin Leong
;
Raghavan, Nagarajan
;
Duenas, Salvador
;
Wang, Tao
;
Xia, Qiangfei
;
Pazos, Sebastian

Journal

ACS NANO

Abstract

Description

Metrics

Downloads

155 since deposited on 2023-06-20
7last month
3last week
Acq. date: 2025-12-09

Views

1195 since deposited on 2023-06-20
Acq. date: 2025-12-09

Citations

Metrics

Downloads

155 since deposited on 2023-06-20
7last month
3last week
Acq. date: 2025-12-09

Views

1195 since deposited on 2023-06-20
Acq. date: 2025-12-09

Citations