Publication:

Standards for the Characterization of Endurance in Resistive Switching Devices

Date

2021
Journal Article Review
https://doi.org/10.1021/acsnano.1c06980
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dc.contributor.authorLanza, Mario
dc.contributor.authorWaser, Rainer
dc.contributor.authorIelmini, Daniele
dc.contributor.authorYang, J. Joshua
dc.contributor.authorGoux, Ludovic
dc.contributor.authorSune, Jordi
dc.contributor.authorKenyon, Anthony Joseph
dc.contributor.authorMehonic, Adnan
dc.contributor.authorSpiga, Sabina
dc.contributor.authorRana, Vikas
dc.contributor.authorWiefels, Stefan
dc.contributor.authorMenzel, Stephan
dc.contributor.authorValov, Ilia
dc.contributor.authorVillena, Marco A.
dc.contributor.authorMiranda, Enrique
dc.contributor.authorJing, Xu
dc.contributor.authorCampabadal, Francesca
dc.contributor.authorGonzalez, Mireia B.
dc.contributor.authorAguirre, Fernando
dc.contributor.authorPalumbo, Felix
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.orcidextLanza, Mario::0000-0003-4756-8632
dc.contributor.orcidextWaser, Rainer::0000-0002-9080-8980
dc.contributor.orcidextIelmini, Daniele::0000-0002-1853-1614
dc.contributor.orcidextKenyon, Anthony Joseph::0000-0003-2249-2184
dc.contributor.orcidextMehonic, Adnan::0000-0002-2476-5038
dc.contributor.orcidextRana, Vikas::0000-0002-3561-5342
dc.contributor.orcidextWiefels, Stefan::0000-0003-2820-9677
dc.contributor.orcidextMenzel, Stephan::0000-0002-4258-2673
dc.contributor.orcidextValov, Ilia::0000-0002-0728-7214
dc.contributor.orcidextVillena, Marco A.::0000-0001-5547-3380
dc.contributor.orcidextMiranda, Enrique::0000-0003-0470-5318
dc.contributor.orcidextCampabadal, Francesca::0000-0001-7758-4567
dc.contributor.orcidextGonzalez, Mireia B.::0000-0001-6792-4556
dc.contributor.orcidextAguirre, Fernando::0000-0001-7793-1194
dc.contributor.orcidextZhu, Kaichen::0000-0003-1195-8751
dc.contributor.orcidextRoldan, Juan Bautista::0000-0003-1662-6457
dc.contributor.orcidextPuglisi, Francesco Maria::0000-0003-0573-4938
dc.contributor.orcidextLarcher, Luca::0000-0002-9139-349X
dc.contributor.orcidextHou, Tuo-Hung::0000-0002-9686-7076
dc.contributor.orcidextProdromakis, Themis::0000-0002-6267-6909
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.accessioned2023-08-04T09:35:43Z
dc.date.available2023-06-20T10:35:57Z
dc.date.available2023-08-04T09:35:43Z
dc.date.embargo2021-11-03
dc.date.issued2021
dc.identifier.doi10.1021/acsnano.1c06980
dc.identifier.issn1936-0851
dc.identifier.pmidMEDLINE:34730935
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41921
dc.publisherAMER CHEMICAL SOC
dc.source.beginpage17214
dc.source.endpage17231
dc.source.issue11
dc.source.journalACS NANO
dc.source.numberofpages18
dc.source.volume15
dc.subject.keywordsNONVOLATILE MEMORY
dc.subject.keywordsGRAPHENE OXIDE
dc.subject.keywordsHIGH-PERFORMANCE
dc.subject.keywordsRESISTANCE MEMORY
dc.subject.keywordsMEMRISTOR
dc.subject.keywordsBIPOLAR
dc.subject.keywordsRERAM
dc.subject.keywordsRRAM
dc.subject.keywordsMEMTRANSISTORS
dc.subject.keywordsSUBSTRATE
dc.title

Standards for the Characterization of Endurance in Resistive Switching Devices

dc.typeJournal article review
dspace.entity.typePublication
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