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Browsing by Author "Caro, J."

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    Accurate modeling of double barrier resonant tunneling diodes

    van de Roer, T.
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    Hendriks, Marton
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    Magnus, Wim  
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    Henini, M.
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    Heyker, H.
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    Kwaspen, M.
    Proceedings paper
    1995, 25th European Solid State Device Research Conference - ESSDERC, 25/09/1995, p.715-718
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    Atomistic understanding of a single gated dopant atom in a MOSFET

    Lansbergen, G.
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    Rahman, R.
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    Wellard, C.
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    Caro, J.
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    Collaert, Nadine  
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    Biesemans, Serge  
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    Klimeck, G.
    Proceedings paper
    2008, Materials and Devices for "Beyond CMOS" Scaling, 24/03/2008, p.1067-B03-07
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    Design of silicon Mach-Zehnder interferometer and ring resonator with a free spectral range tolerant against waveguide-width variations

    Ouyang, B.
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    Bogaerts, Wim  
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    Caro, J.
    Proceedings paper
    2018, IEEE Photonics Benelux Chapter/ Annual Symposium 2018, 15/11/2018
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    Direct observation by resonant tunneling of the B+ level in a delta-doped silicon barrier

    Caro, J.
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    Vink, I.D.
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    Smit, G.D.J.
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    Rogge, S.
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    Klapwijk, T.M.
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    Loo, Roger  
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    Caymax, Matty  
    Journal article
    2004, Physical Review B, (69) 12, p.125324-1-125324-5
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    Gate-induced quantum- confinement transition of a single dopant atom in a silicon FinFET

    Lansbergen, G.P.
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    Rahman, R.
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    Wellard, C.J.
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    Woo, I.
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    Caro, J.
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    Collaert, Nadine  
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    Biesemans, Serge  
    Journal article
    2008, Nature Physics, (4) 8, p.656-661
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    Subthreshold channels at the edges of nanoscale triple-gate silicon transistors

    Sellier, H.
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    Lansbergen, G.P.
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    Caro, J.
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    Rogge, Sven
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    Collaert, Nadine  
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    Ferain, Isabelle
    Journal article
    2007, Applied Physics Letters, (90) 7, p.73502
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    Towards Tunneling Through a Single Dopant Atom

    Caro, J.
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    Smit, G.D.J.
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    Sellier, H.
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    Loo, Roger  
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    Caymax, Matty  
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    Rogge, S.
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    Klapwijk, T.M.
    Proceedings paper
    2005, PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors - ICPS-27, 26/07/2004, p.1587
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    Transport-based dopant metrology in advanced FinFETs

    Lansbergen, G.P.
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    Rahman, R.
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    Wellard, C.J.
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    Caro, J.
    ;
    Collaert, Nadine  
    ;
    Biesemans, Serge  
    Proceedings paper
    2008, Technical Digest International Electron Devices Meeting - IEDM, 15/12/2008, p.713-716

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