Browsing by Author "Chan, Boon Teik"
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Publication CFET SRAM DTCO, Interconnect Guideline, and Benchmark for CMOS Scaling
Journal article2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 3, p.883-890Publication CFET SRAM With Double-Sided Interconnect Design and DTCO Benchmark
Journal article2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 10, p.5099-5106