CFET SRAM With Double-Sided Interconnect Design and DTCO Benchmark

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Author(s)

Liu, Hsiao-Hsuan

;

Schuddinck, Pieter

;

;

Verschueren, Lynn

;

;

Salahuddin, Shairfe Muhammad

;

Hiblot, Gaspard

;

;

Chan, Boon Teik

;

Subramanian, Sujith

;

;

Hellings, Geert

;

Garcia Bardon, Marie

;

Ryckaert, Julien

;

;

Catthoor, Francky

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Metrics

1161 since deposited on 2023-09-19

Acq. date: 2025-10-25