Publication:

CFET SRAM With Double-Sided Interconnect Design and DTCO Benchmark

Date

2023

Journal article

https://doi.org/10.1109/TED.2023.3305322

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Author(s)

Liu, Hsiao-Hsuan

;

Schuddinck, Pieter

;

;

Verschueren, Lynn

;

;

Salahuddin, Shairfe Muhammad

;

Hiblot, Gaspard

;

;

Chan, Boon Teik

;

Subramanian, Sujith

;

;

Hellings, Geert

;

Garcia Bardon, Marie

;

Ryckaert, Julien

;

;

Catthoor, Francky

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Metrics

1165 since deposited on 2023-09-19

2last month

1last week

Acq. date: 2025-12-13