CFET SRAM DTCO, Interconnect Guideline, and Benchmark for CMOS Scaling

Liu, Hsiao-Hsuan; Salahuddin, Shairfe Muhammad; Chan, Boon Teik; Schuddinck, Pieter; Xiang, Yang; Hellings, Geert; Weckx, Pieter; Ryckaert, Julien; Catthoor, Francky

doi:10.1109/TED.2023.3235701

Publication:

CFET SRAM DTCO, Interconnect Guideline, and Benchmark for CMOS Scaling

Date

2023

Journal article

https://doi.org/10.1109/TED.2023.3235701

Simple item page Full metadata Statistics

Files

Published version 13.11 MB

Author(s)

Liu, Hsiao-Hsuan

;

Salahuddin, Shairfe Muhammad

;

;

;

;

;

;

;

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Metrics

1 since deposited on 2023-05-11

Acq. date: 2026-01-07

1291 since deposited on 2023-05-11

Acq. date: 2026-01-06

CFET SRAM DTCO, Interconnect Guideline, and Benchmark for CMOS Scaling

Date

Files

Author(s)

Journal

Abstract

Description

Metrics

Downloads

Views

Citations

Metrics

Downloads

Views

Citations