Publication:

CFET SRAM DTCO, Interconnect Guideline, and Benchmark for CMOS Scaling

Date

2023
Journal article
https://doi.org/10.1109/TED.2023.3235701
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dc.contributor.authorLiu, Hsiao-Hsuan
dc.contributor.authorSalahuddin, Shairfe Muhammad
dc.contributor.authorChan, Boon Teik
dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorXiang, Yang
dc.contributor.authorHellings, Geert
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRyckaert, Julien
dc.contributor.authorCatthoor, Francky
dc.contributor.imecauthorLiu, Hsiao-Hsuan
dc.contributor.imecauthorSalahuddin, Shairfe Muhammad
dc.contributor.imecauthorChan, Boon Teik
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorXiang, Yang
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorRyckaert, Julien
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecSchuddinck, Pieter::0000-0003-1893-3135
dc.contributor.orcidimecXiang, Yang::0000-0003-0091-6935
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecSalahuddin, Shairfe Muhammad::0000-0002-6483-8430
dc.date.accessioned2023-07-04T12:12:12Z
dc.date.available2023-05-11T20:16:26Z
dc.date.available2023-07-04T12:12:12Z
dc.date.embargo9999-12-31
dc.date.issued2023
dc.identifier.doi10.1109/TED.2023.3235701
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41582
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage883
dc.source.endpage890
dc.source.issue3
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages8
dc.source.volume70
dc.title

CFET SRAM DTCO, Interconnect Guideline, and Benchmark for CMOS Scaling

dc.typeJournal article
dspace.entity.typePublication
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