Browsing by Author "Chang, Ting-Chang"
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Publication An Analytical Method for Parameter Extraction in Oxide Semiconductor Field-Effect Transistors
Journal article2021, IEEE TRANSACTIONS ON ELECTRON DEVICES, (68) 6, p.2717-2722Publication On the impact of Gate field-plate length and barrier layer thickness on TDDB lifetime of GaN-on-Si MISHEMT devices for RF/5G/mm-Wave applications
Proceedings paper2020, IEEE International Integrated Reliability Workshop (IIRW), OCT 04-NOV 01, 2020, p.24-30Publication Origin of High Current and Illumination Stress Instability in Self-Aligned a-InGaZnO Thin Film Transistors With Al2O3 as High-κ Gate Dielectric
Journal article2020, IEEE Electron Device Letters, (41) 4, p.565-568