Publication:
On the impact of Gate field-plate length and barrier layer thickness on TDDB lifetime of GaN-on-Si MISHEMT devices for RF/5G/mm-Wave applications
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1775 since deposited on 2021-11-02
Acq. date: 2025-10-26
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Views
1775 since deposited on 2021-11-02
Acq. date: 2025-10-26
Citations