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An Analytical Method for Parameter Extraction in Oxide Semiconductor Field-Effect Transistors
Publication:
An Analytical Method for Parameter Extraction in Oxide Semiconductor Field-Effect Transistors
Date
2021
Journal article
https://doi.org/10.1109/TED.2021.3072878
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chien, Yu-Chieh
;
Londono Ramirez, Horacio
;
Kuo, Chuan-Wei
;
Tsao, Yu-Ching
;
Nag, Manoj
;
Chang, Ting-Chang
;
Ang, Kah-Wee
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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1664
since deposited on 2021-11-02
Acq. date: 2025-10-26
Citations
Metrics
Views
1664
since deposited on 2021-11-02
Acq. date: 2025-10-26
Citations