Browsing by Author "Chen, Pei Jun"
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Publication Direct measurement of barrier height at the HfO2/poly-Si interface:
Proceedings paper2004-06, VLSI Technology Symposium, 15/06/2004, p.122-123Publication Valence-band electron-tunneling measurement of the gate work function: application to the high-k / polycrystalline-silicon interface
Journal article2005, Journal of Applied Physics, (98) 5, p.53712