Browsing by Author "Chen, Zhe"
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Publication Impact of the filament morphology on the retention characteristics of Cu/Al2O3-based CBRAM devices
Proceedings paper2016, IEEE International Electron Devices Meeting - IEDM, 3/12/2016, p.556-559Publication Impact of tungsten oxidation conditions on the performance of Al2O3/WOx-based CBRAM devices
Journal article2017, Microelectronic Engineering, 178, p.56-59Publication Voltage-controlled reverse filament growth boosts resistive switching memory
Journal article2018, Nano Research, (11) 8, p.4017-4025