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Browsing by Author "Ciofi, I."

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    Cu interconnect lifetime estimation in the presence of thermal gradients

    Ding, Y.
    ;
    Pedreira, O. Varela
    ;
    Lofrano, M.
    ;
    Zahedmanesh, H.
    ;
    Ciofi, I.
    ;
    Chavez, T.
    ;
    Farr, H.
    Journal article
    2025-FEB 21, JOURNAL OF APPLIED PHYSICS, (137) 7
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    Low-Frequency Noise Characterization of BEOL Metal-Insulator-Metal Capacitors

    Giusi, G.
    ;
    Saini, Nishant  
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    Croes, K.
    ;
    Ciofi, I.
    ;
    Scandurra, G.
    ;
    Ciofi, C.
    ;
    Tierno, D.
    Journal article
    2025-APR, IEEE TRANSACTIONS ON ELECTRON DEVICES, (72) 4, p.1933-1938
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    Three-Dimensional Modeling of BEOL TDDB: Variability Specs for Sub-20 nm Half-Pitch Interconnects

    Fang, Yu
    ;
    Ciofi, I.
    ;
    Roussel, Ph. J.
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    Lesniewska, A.
    ;
    Carballo, V. M. Blanco
    ;
    Degraeve, R.
    ;
    Wolf, I. De
    Journal article
    2025-APR 7, IEEE TRANSACTIONS ON ELECTRON DEVICES

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