Browsing by Author "Ciofi, I."
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Publication Cu interconnect lifetime estimation in the presence of thermal gradients
;Ding, Y. ;Pedreira, O. Varela ;Lofrano, M. ;Zahedmanesh, H. ;Ciofi, I. ;Chavez, T.Farr, H.Journal article2025-FEB 21, JOURNAL OF APPLIED PHYSICS, (137) 7Publication Low-Frequency Noise Characterization of BEOL Metal-Insulator-Metal Capacitors
Journal article2025-APR, IEEE TRANSACTIONS ON ELECTRON DEVICES, (72) 4, p.1933-1938Publication Three-Dimensional Modeling of BEOL TDDB: Variability Specs for Sub-20 nm Half-Pitch Interconnects
;Fang, Yu ;Ciofi, I. ;Roussel, Ph. J. ;Lesniewska, A. ;Carballo, V. M. Blanco ;Degraeve, R.Wolf, I. DeJournal article2025-APR 7, IEEE TRANSACTIONS ON ELECTRON DEVICES