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Articles
Low-Frequency Noise Characterization of BEOL Metal-Insulator-Metal Capacitors
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Low-Frequency Noise Characterization of BEOL Metal-Insulator-Metal Capacitors
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Date
2025-APR
Journal article
https://doi.org/10.1109/TED.2025.3542748
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Giusi, G.
;
Saini, Nishant
;
Croes, Kristof
;
Ciofi, Ivan
;
Scandurra, G.
;
Ciofi, C.
;
Tierno, Davide
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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Views
149
since deposited on 2025-04-13
5
last month
3
last week
Acq. date: 2026-01-25
Citations