Publication:
Low-Frequency Noise Characterization of BEOL Metal-Insulator-Metal Capacitors
| dc.contributor.author | Giusi, G. | |
| dc.contributor.author | Saini, Nishant | |
| dc.contributor.author | Croes, K. | |
| dc.contributor.author | Ciofi, I. | |
| dc.contributor.author | Scandurra, G. | |
| dc.contributor.author | Ciofi, C. | |
| dc.contributor.author | Tierno, D. | |
| dc.contributor.imecauthor | Saini, Nishant | |
| dc.contributor.imecauthor | Croes, K. | |
| dc.contributor.imecauthor | Ciofi, I. | |
| dc.contributor.imecauthor | Tierno, D. | |
| dc.contributor.orcidimec | Saini, Nishant::0000-0002-3807-3761 | |
| dc.date.accessioned | 2025-04-13T04:30:52Z | |
| dc.date.available | 2025-04-13T04:30:52Z | |
| dc.date.issued | 2025-APR | |
| dc.description.wosFundingText | This work was supported by the Next Generation European Union-National Recovery and Resilience Plan (EUNRRP), Mission 4, Component 2, under Grant CUP J53D23016160001. The work of Nishant Saini was supported by the Research Foundation Flanders (FWO), Belgium through the Ph.D. Fellowship-Strategic Basic Research under Grant 1SH0P24N. | |
| dc.identifier.doi | 10.1109/TED.2025.3542748 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/45529 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 1933 | |
| dc.source.endpage | 1938 | |
| dc.source.issue | 4 | |
| dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
| dc.source.numberofpages | 6 | |
| dc.source.volume | 72 | |
| dc.subject.keywords | WORK FUNCTION | |
| dc.subject.keywords | GATE ELECTRODE | |
| dc.subject.keywords | CHALLENGES | |
| dc.subject.keywords | FILM | |
| dc.title | Low-Frequency Noise Characterization of BEOL Metal-Insulator-Metal Capacitors | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |