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Browsing by Author "Clark, Benjamin L."

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    Demonstration of an N7 integrated fab process for metal oxide EUV photoresist

    De Simone, Danilo  
    ;
    Mao, Ming  
    ;
    Kocsis, Michael  
    ;
    De Schepper, Peter  
    ;
    Lazzarino, Frederic  
    Proceedings paper
    2016, Extreme Ultraviolet (EUV) Lithography VII, 21/02/2016, p.97760B
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    Integrated fab process for metal oxide EUV photoresist

    Grenville, Andrew
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    Anderson, Jeremy T.
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    Clark, Benjamin L.
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    De Schepper, Peter  
    ;
    Edson, Joseph
    Proceedings paper
    2015, Advances in Patterning Materials and Processes XXXII, 22/02/2015, p.94250S
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    Optimization of Point-Of-Use Filtration for Metal Oxide Photoresist

    Wu, Aiwen
    ;
    Tang, Harvey
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    Conner, Gregg
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    Chang, Shu Hao  
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    Giordano, Gaetano  
    ;
    Smiddy, Dominick
    Proceedings paper
    2021, Conference on Advances in Patterning Materials and Processes XXXVIII Part of SPIE Advanced Lithography Conference, FEB 22-26, 2021, p.116120X

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