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Browsing by Author "Colina, Alberto"

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    Image placement error: closing the gap between overlay and imaging

    Hendrickx, Eric  
    ;
    Colina, Alberto
    ;
    van der Hoff, Alex
    ;
    Finders, Jo
    ;
    Vandenberghe, Geert  
    Journal article
    2005, Journal Microlith., Microfab., Microsyst., (JM3), (4) 3, p.33006
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    LCDU decomposition and scaling: mask and resist effects on local MEEF and stochastics

    Gustas, Dominykas
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    Borman, Sam
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    Oorschot, Dorothe
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    Bekaert, Joost  
    ;
    Van Loo, Hilbert
    Proceedings paper
    2024, 2024 International Conference on Extreme Ultraviolet Lithography, SEP 30-OCT 03, 2024, p.Art. 132150Q
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    Logic via printability enhancement using restricted via placement and exhaustive SRAF placement on a staggered grid

    Woltgens, Pieter
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    Colina, Alberto
    ;
    Rio, David
    ;
    Delorme, Max  
    ;
    Kovalevich, Tatiana  
    ;
    Thiam, Arame  
    Proceedings paper
    2022-05-26, Conference on Optical and EUV Nanolithography XXXV Part of SPIE Advanced Conference, APR 24-MAY 27, 2022, p.120510I
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    Pattern displacement induced by lens aberrations

    Hendrickx, Eric  
    ;
    Vandenberghe, Geert  
    ;
    Ronse, Kurt  
    ;
    Colina, Alberto
    ;
    van der Hoff, Alex
    Proceedings paper
    2002, 22nd Annual Bacus Symposium on Photomask Technology, 1/10/2002, p.1155-1162

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