Browsing by Author "Cosnier, Thibault"
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Publication 1.2 kV Enhancement-Mode p-GaN Gate HEMTs on 200 mm Engineered Substrates
Journal article2024, IEEE ELECTRON DEVICE LETTERS, (45) 4, p.657-660Publication 200 V GaN-on-SOI Smart Power Platform for Monolithic GaN Power ICs
; ; ; ; ; Proceedings paper2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021Publication A fully integrated half-bridge driver circuit in All-GaN GAN-IC technology
Journal article2023, SOLID-STATE ELECTRONICS, (207) September, p.Art. 108707Publication Analysis and Design of a Fully-Integrated Pulsed LiDAR Driver in 100V-GaN IC Technology
Proceedings paper2022, 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME), JUN 12-15, 2022, p.193-196Publication Analysis of inverter architectures in a GaN-IC technology
Proceedings paper2024, 11th Workshop on Wide Bandgap Power Devices and Applications, NOV 04-06, 2024Publication Device optimization for 200V GaN-on-SOI Platform for Monolithicly Integrated Power Circuits
Proceedings paper2022, 52nd IEEE European Solid-State Device Research Conference (ESSDERC), SEP 19-22, 2022, p.245-248Publication GaN-on-SOI: Monolithically integrated all GaN ICs for power conversion
; ; ; ; ; Proceedings paper2019, IEEE International Electron Devices Meeting - IEDM, 7/12/2019, p.78-81Publication Monolithic 650-V Dual-Gate p-GaN Bidirectional Switch
Journal article2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 11, p.6904-6909Publication TCAD-based design and verification of the components of a 200 V GaN-IC platform
Journal article2023, SOLID-STATE ELECTRONICS, (200) February, p.Art.: 108496Publication Thermal characterization of GaN lateral power HEMTs on Si, SOI, and poly-AlN substrates
Journal article2021, MICROELECTRONICS RELIABILITY, 118, p.114061Publication Thermal resistance characterization of GaN power HEMTs on Si, SOI, and poly-AlN substrates
Proceedings paper2020, 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), JUL 05-08, 2020