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Thermal characterization of GaN lateral power HEMTs on Si, SOI, and poly-AlN substrates
Publication:
Thermal characterization of GaN lateral power HEMTs on Si, SOI, and poly-AlN substrates
Date
2021
Journal article
https://doi.org/10.1016/j.microrel.2021.114061
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Magnani, Alessandro
;
Cosnier, Thibault
;
Amirifar, Nooshin
;
Chatterjee, Urmimala
;
Zhao, Ming
;
Li, Xiangdong
;
Geens, Karen
;
Decoutere, Stefaan
Journal
MICROELECTRONICS RELIABILITY
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1899
since deposited on 2022-02-21
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Acq. date: 2025-10-28
Citations
Metrics
Views
1899
since deposited on 2022-02-21
1
last week
Acq. date: 2025-10-28
Citations