Browsing by Author "Cova, P."

Now showing 1 - 2 of 2

Hot electron degradation effects in Al0.25Ga0.75As/In0.2Ga0.8As/GaAs PHEMTs

Cova, P.
;
Menozzi, R.
;
Lacey, D.
;
Baeyens, Yves
;
Fantini, F.
Proceedings paper
1995, IEEE 1995 Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO; 27 Nov. 1995; Londo, p.98-103
The effect of hot electron stress on the DC and microwave characteristics of AlGaAs/InGaAs/GaAs PHEMTs

Menozzi, R.
;
Borgarino, M.
;
Cova, P.
;
Baeyens, Yves
;
Fantini, F.
Journal article
1996, Microelectronics and Reliability, (36) 11_12, p.1899-1902