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Conference contributions
Hot electron degradation effects in Al0.25Ga0.75As/In0.2Ga0.8As/GaAs PHEMTs
Publication:
Hot electron degradation effects in Al0.25Ga0.75As/In0.2Ga0.8As/GaAs PHEMTs
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Date
1995
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cova, P.
;
Menozzi, R.
;
Lacey, D.
;
Baeyens, Yves
;
Fantini, F.
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Abstract
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2101
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Acq. date: 2025-12-10
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Metrics
Views
2101
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-10
Citations