Publication:
Hot electron degradation effects in Al0.25Ga0.75As/In0.2Ga0.8As/GaAs PHEMTs
Date
| dc.contributor.author | Cova, P. | |
| dc.contributor.author | Menozzi, R. | |
| dc.contributor.author | Lacey, D. | |
| dc.contributor.author | Baeyens, Yves | |
| dc.contributor.author | Fantini, F. | |
| dc.date.accessioned | 2021-09-29T13:04:45Z | |
| dc.date.available | 2021-09-29T13:04:45Z | |
| dc.date.issued | 1995 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/572 | |
| dc.source.beginpage | 98 | |
| dc.source.conference | IEEE 1995 Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO; 27 Nov. 1995; Londo | |
| dc.source.conferencelocation | ||
| dc.source.endpage | 103 | |
| dc.title | Hot electron degradation effects in Al0.25Ga0.75As/In0.2Ga0.8As/GaAs PHEMTs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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