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The effect of hot electron stress on the DC and microwave characteristics of AlGaAs/InGaAs/GaAs PHEMTs
Publication:
The effect of hot electron stress on the DC and microwave characteristics of AlGaAs/InGaAs/GaAs PHEMTs
Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Menozzi, R.
;
Borgarino, M.
;
Cova, P.
;
Baeyens, Yves
;
Fantini, F.
Journal
Microelectronics and Reliability
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1891
since deposited on 2021-09-29
434
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Acq. date: 2025-10-24
Citations
Metrics
Views
1891
since deposited on 2021-09-29
434
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations