Publication:
The effect of hot electron stress on the DC and microwave characteristics of AlGaAs/InGaAs/GaAs PHEMTs
Date
| dc.contributor.author | Menozzi, R. | |
| dc.contributor.author | Borgarino, M. | |
| dc.contributor.author | Cova, P. | |
| dc.contributor.author | Baeyens, Yves | |
| dc.contributor.author | Fantini, F. | |
| dc.date.accessioned | 2021-09-29T14:45:48Z | |
| dc.date.available | 2021-09-29T14:45:48Z | |
| dc.date.issued | 1996 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1345 | |
| dc.source.beginpage | 1899 | |
| dc.source.endpage | 1902 | |
| dc.source.issue | 11_12 | |
| dc.source.journal | Microelectronics and Reliability | |
| dc.source.volume | 36 | |
| dc.title | The effect of hot electron stress on the DC and microwave characteristics of AlGaAs/InGaAs/GaAs PHEMTs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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