Browsing by Author "Croes, K."
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Publication Analytical bounds for the MLE of the Weibull shape parameter
Proceedings paper2002, Communications of the 3rd International Conference on Mathematical Methods in Reliability - MMR, 17/06/2002, p.31-34Publication Application of general finite mixture models to reliability data using likelihood estimation
Publication Cu interconnect lifetime estimation in the presence of thermal gradients
Publication Moisture induced failures in flip chip on flex interconnections using anisotropic conductive adhesives
Proceedings paper2003, Proceedings of the Business of Electronic Product Reliability and Reliability, 13/01/2003Publication Multi-step trap-assisted tunneling in Al-doped HfO2 used in advanced 2.5D metal-insulator-metal capacitors
Publication Statistical aspects of the degradation of LDD nMOSFETs
Journal article2002, Microelectronics Reliability, (42) 9_11, p.1409-1413Publication The use of random effects in modeling non-linear hot-carrier degradation data
Proceedings paper2002, Communications of the 3rd International Conference on Mathematical Methods in Reliability - MMR, 17/06/2002, p.35-38Publication Three-Dimensional Modeling of BEOL TDDB: Variability Specs for Sub-20 nm Half-Pitch Interconnects