Browsing by Author "Croes, K."

Now showing 1 - 5 of 5

Analytical bounds for the MLE of the Weibull shape parameter

Andries, E.
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Croes, K.
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De Ceuninck, Ward
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De Schepper, Luc
;
Molenberghs, G.
Proceedings paper
2002, Communications of the 3rd International Conference on Mathematical Methods in Reliability - MMR, 17/06/2002, p.31-34
Application of general finite mixture models to reliability data using likelihood estimation

Andries, E.
;
Croes, K.
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De Schepper, Luc
;
Molenberghs, G.
Proceedings paper
2003, 18th International Workshop on Statistical Modelling - IWSM, 7/07/2003, p.33-38
Moisture induced failures in flip chip on flex interconnections using anisotropic conductive adhesives

Caers, J.F.J.M.
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Zhao, X.J.
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Lekens, Geert
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Dreesen, R.
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Croes, K.
;
Wong, E.H.
Proceedings paper
2003, Proceedings of the Business of Electronic Product Reliability and Reliability, 13/01/2003
Statistical aspects of the degradation of LDD nMOSFETs

Andries, E.
;
Dreesen, R.
;
Croes, K.
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De Ceuninck, Ward
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De Schepper, Luc
;
Groeseneken, Guido
Journal article
2002, Microelectronics Reliability, (42) 9_11, p.1409-1413
The use of random effects in modeling non-linear hot-carrier degradation data

Andries, E.
;
Croes, K.
;
Dreesen, R.
;
De Ceuninck, Ward
;
De Schepper, Luc
Proceedings paper
2002, Communications of the 3rd International Conference on Mathematical Methods in Reliability - MMR, 17/06/2002, p.35-38