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The use of random effects in modeling non-linear hot-carrier degradation data
Publication:
The use of random effects in modeling non-linear hot-carrier degradation data
Date
2002
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Andries, E.
;
Croes, K.
;
Dreesen, R.
;
De Ceuninck, Ward
;
De Schepper, Luc
Journal
Abstract
Description
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Views
2001
since deposited on 2021-10-14
423
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
2001
since deposited on 2021-10-14
423
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations