The use of random effects in modeling non-linear hot-carrier degradation data

dc.contributor.author	Andries, E.
dc.contributor.author	Croes, K.
dc.contributor.author	Dreesen, R.
dc.contributor.author	De Ceuninck, Ward
dc.contributor.author	De Schepper, Luc
dc.contributor.imecauthor	De Ceuninck, Ward
dc.date.accessioned	2021-10-14T21:07:14Z
dc.date.available	2021-10-14T21:07:14Z
dc.date.issued	2002
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/5956
dc.source.beginpage	35
dc.source.conference	Communications of the 3rd International Conference on Mathematical Methods in Reliability - MMR
dc.source.conferencedate	17/06/2002
dc.source.conferencelocation	Trondheim Norway
dc.source.endpage	38
dc.title	The use of random effects in modeling non-linear hot-carrier degradation data
dc.type	Proceedings paper
dspace.entity.type	Publication
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