Browsing by Author "Dal Santo, G."
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Publication A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps
Proceedings paper2012, International Electron Devices Meeting - IEDM, 10/12/2012, p.13.3Publication Reverse-bias degradation of AlGaN/GaN vertical Schottky diodes: an investigation based on electrical and capacitive measurements
Proceedings paper2012, International Symposium on Compound Semiconductor, 27/08/2012